A Comparison of Domain Images Obtained for Nanophase Alloys by Magnetic Force Microscopy and High Resolution Lorentz Electron Microscopy

IEEE Transactions on Magnetics

Volumn 31, Issue 6, 1995, Pages 3349-3351

  Gibbs, M R J ^a   Al Khafaji, M A ^a   Rainforth, W M ^a   Davies, H A ^a   Babcock, K ^b   Chapman, J N ^c   Heyderman, L J ^c  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b Digital Instruments   (United States)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; MAGNETIC MATERIALS; MAGNETIC RESONANCE IMAGING; MAGNETIC VARIABLES MEASUREMENT; MAGNETOSTATICS; MICROSCOPES; NANOSTRUCTURED MATERIALS; X RAY DIFFRACTION ANALYSIS;

DIGITAL INSTRUMENT NANOSCOPE; FORCE GRADIENTS; HIGH RESOLUTION LORENTZ ELECTRON MICROSCOPY; MAGNETIC FORCE MICROSCOPY;

MAGNETIC DOMAINS;

EID: 0029406044     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.490378     Document Type: Article

References (10)

1. Y.Martin and H.K.Wickramasinghe, Appl. Phys. Lett. 50 (1987) 1455
2. J.N.Chapman, R.P.Ferrier, L.J.Heyderman, S.McVitie, W.A.P.Nicholson and B.Bormans, EMAG93, IoP Conf. Ser. 138 (1993) 1, IoP Publishing, Bristol, UK
3. H.A.Davies, A.Manaf, M.Leonowicz, P.Z.Zhang, S.J.Dobson and. R.A.Buckley, Nanostruct. Mater. 2 (1993) 197
4. J.N.Chapman, S.Young, H.A.Davies, P.Z.Zhang, A.Manaf and R.A.Buckley, Proc. 13th. Int. Workshop on R.E.Magnets & their Applications, Univ. Birmingham, (1994) pp. 95–101
5. J.N.Chapman, L.J.Heyderman, S.Young, D.M.Donnet, P.Z.Zhang and H.A.Davies, in press
6. P.Grutter et al, J.Appl.Phys. (67 (1990) 1437
7. Y.Yoshizawa and K.Yamauchi, Mater. Sci. Eng. A133 (1991) 176
8. J.Nogués, B.Rodbell and K.V.Rao, J. Vac. Sci. Technol. B. 12 (1994) 1851
9. G.Herzer, IEEE Trans. Mag. 26 (1990) 1397
10. R.Grössinger et al, IEEE Trans. Mag. 26 (1990) 1403