Soft Magnetic Properties of Fe-TM-C-N (TM : Zr, Nb) Nanocrystaliine Films

IEEE Transactions on Magnetics

Volumn 31, Issue 6, 1995, Pages 3868-3870

  Ryu, H J ^a   Lee, J J ^a   Han, S H ^b   Kim, H J ^b   Kang, I K ^b   Choi, J O ^c  

^a Seoul National University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c Institute for Advanced Engineering (IAE)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COMPOSITION EFFECTS; CRYSTALLINE MATERIALS; CRYSTALLIZATION; IRON ALLOYS; MAGNETIC PROPERTIES; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL); SPUTTER DEPOSITION;

SOFT MAGNETIC PROPERTIES;

MAGNETIC FILMS;

EID: 0029403618     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.489799     Document Type: Article

References (4)

1. N. Hasegawa, M. Saito, A. Kojima, A. Makino, Y. Misaki and T.Watanabe, “Crystallization Behavior of Fe-M-C (M:Ti, Zr, Hf, V, Nb, Ta) Films”, J. Mag. Soc. Jpn., 14, 319 (1990).
2. H. Hoffman, “Quantitative Calculation of Magnetic Riffle of Uniaxial Thin Permalloy Films”, J.Appl.Phys., 35, 1790 (1964).
3. J. O. Choi, J. J. Lee, S. H. Han, H. J. Kim, and I. K. Kang, “Soft Magnetic Properties of Nanocrystalline Fe-Hf-C-N Films”, J.Appl.Phys., 75, 5785 (1994).
4. B. D. Cullity, Elements of X-ray Diffraction, (Addison-Wesley Pub. Co., London, 1978)