Hydrothermally grown BaZrO3 films on zirconium metal: Microstructure, x-ray photoelectron spectroscopy, and Auger electron spectroscopy depth profiling

Journal of Materials Research

Volumn 10, Issue 11, 1995, Pages 2749-2754

  Fuenzalida, V M ^a   Pilleux, M E ^a  

^a UNIVERSITY OF CHILE   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BARIUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; FILM GROWTH; INTERFACES (MATERIALS); PERMITTIVITY; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIUM;

AUGER ELECTRON SPECTROSCOPY DEPTH PROFILING; BARIUM ZIRCONATE FILM; GRAZING ANGLE X-RAY DIFFRACTION ANALYSIS; HYDROTHERMAL PREPARATION;

CERAMIC COATINGS;

EID: 0029403322     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1995.2749     Document Type: Article

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