Modeling and Performance of Wafer-Fused Resonant-Cavity Enhanced Photodetectors

IEEE Journal of Quantum Electronics

Volumn 31, Issue 10, 1995, Pages 1863-1875

  Tan, I Hsing ^a   Hu, Evelyn L ^b   Bowers, John E ^b   Miller, B I ^c  

^a HEWLETT PACKARD COMPANY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CAVITY RESONATORS; CROSSTALK; LIGHT REFLECTION; MATHEMATICAL MODELS; MATRIX ALGEBRA; MIRRORS; OPTICAL COMMUNICATION; QUANTUM EFFICIENCY; SILICA; TRANSFER FUNCTIONS; TUNING;

ABSORPTION BANDWIDTH; HARD MIRROR; QUARTER WAVELENGTH STACKS; RESONANT CAVITY ENHANCED PHOTODETECTORS; STANDING WAVE EFFECTS; TRANSMISSION MATRIX; WAVELENGTH TUNING;

PHOTODETECTORS;

EID: 0029394238     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/3.466063     Document Type: Article

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