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Volumn 14, Issue 10, 1995, Pages 1231-1240

Massively Parallel Electromagnetic Simulation for Photolithographic Applications

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER SIMULATION; CONVERGENCE OF NUMERICAL METHODS; ELECTROMAGNETIC WAVE POLARIZATION; FINITE DIFFERENCE METHOD; MASKS; PHASE SHIFTERS; PHOTOLITHOGRAPHY; TIME DOMAIN ANALYSIS;

EID: 0029391750     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.466339     Document Type: Article
Times cited : (16)

References (29)
  • 2
    • 0001291022 scopus 로고
    • Alignment errors from resist coat topography
    • N. Bobroff and A. Rosenbluth, “Alignment errors from resist coat topography,” J. Vac. Sci. Technol. B, vol. 6, no. 1, pp. 403–408, 1988.
    • (1988) J. Vac. Sci. Technol. B , vol.6 , Issue.1 , pp. 403-408
    • Bobroff, N.1    Rosenbluth, A.2
  • 6
    • 0026222731 scopus 로고
    • Massively parallel algorithms for scattering in optical lithography
    • Sept.
    • R. Guerrieri, K. H. Tadros, J. Gamelin, and A. R. Neureuther, “Massively parallel algorithms for scattering in optical lithography,” IEEE Trans. Computer-Aided Design, vol. 10, no. 9, pp. 1091–1100, Sept. 1991.
    • (1991) IEEE Trans. Computer-Aided Design , vol.10 , Issue.9 , pp. 1091-1100
    • Guerrieri, R.1    Tadros, K.H.2    Gamelin, J.3    Neureuther, A.R.4
  • 8
    • 0038461870 scopus 로고
    • Theoretical models for the optical alignment of wafer steppers
    • C. P. Kirk, “Theoretical models for the optical alignment of wafer steppers,” in Proc. SPIE, Opt./Laser Microlithography VI, 1987, vol. 772, pp. 134–141.
    • (1987) Proc. SPIE, Opt./Laser Microlithography VI , vol.772 , pp. 134-141
    • Kirk, C.P.1
  • 9
    • 0344794511 scopus 로고
    • Finite difference method for electromagnetic scattering problems
    • Amsterdam: Elsevier Sci.
    • C. F. Lee, R. T. Shin, and J. A. Kong, “Finite difference method for electromagnetic scattering problems,” in PIER 4: Progress in Electromagnetics Research. Amsterdam: Elsevier Sci., 1991, pp. 415–435.
    • (1991) PIER 4: Progress in Electromagnetics Research. , pp. 415-435
    • Lee, C.F.1    Shin, R.T.2    Kong, J.A.3
  • 10
    • 4243139592 scopus 로고
    • A new vector 2D photolithography simulation tool
    • K. D. Lucas and A. J. Strojwas, “A new vector 2D photolithography simulation tool,” in IEDM Tech. Dig., 1992, pp. 177–180.
    • (1992) IEDM Tech. Dig. , pp. 177-180
    • Lucas, K.D.1    Strojwas, A.J.2
  • 11
  • 12
    • 0023345834 scopus 로고
    • Two-dimensional simulation of photolithography on reflective stepped substrate
    • T. Matsuzawa, A. Moniwa, N. Hasegawa, and H. Sunami, “Two-dimensional simulation of photolithography on reflective stepped substrate,” IEEE Trans. Computer-Aided Design, vol. CAD-6, no. 3, pp. 446–451, 1987.
    • (1987) IEEE Trans. Computer-Aided Design , vol.CAD-6 , Issue.3 , pp. 446-451
    • Matsuzawa, T.1    Moniwa, A.2    Hasegawa, N.3    Sunami, H.4
  • 13
    • 0019632712 scopus 로고
    • Absorbing boundary conditions for the finite-difference approximation of the time-domain electromagnetic-field equations
    • Nov.
    • G. Mur, “Absorbing boundary conditions for the finite-difference approximation of the time-domain electromagnetic-field equations,” IEEE Trans. Electromagn. Compat., vol. EMC-23, pp. 377–382, Nov. 1981.
    • (1981) IEEE Trans. Electromagn. Compat. , vol.EMC-23 , pp. 377-382
    • Mur, G.1
  • 14
    • 0141458734 scopus 로고
    • Effects of absorber topography and multilayer coating defects on reflective masks for soft x-ray EUV projection lithography
    • K. Nguyen, A. Wong, A. Neureuther, and D. Attwood, “Effects of absorber topography and multilayer coating defects on reflective masks for soft x-ray EUV projection lithography,” in Proc. SPIE, Lithographies Manufacturing III, 1993, vol. 1924, pp. 418–434.
    • (1993) Proc. SPIE, Lithographies Manufacturing III , vol.1924 , pp. 418-434
    • Nguyen, K.1    Wong, A.2    Neureuther, A.3    Attwood, D.4
  • 15
    • 0009852064 scopus 로고
    • Optical microscope imaging of lines patterned in thick layers with variable edge geometry: Theory
    • D. Nyyssonen and C. P. Kirk, “Optical microscope imaging of lines patterned in thick layers with variable edge geometry: Theory,” J. Opt. Soc. Amer., vol. 5, no. 8, pp. 1270–1280, 1988.
    • (1988) J. Opt. Soc. Amer. , vol.5 , Issue.8 , pp. 1270-1280
    • Nyyssonen, D.1    Kirk, C.P.2
  • 17
    • 65849090118 scopus 로고
    • Phase-shifting mask topography effects on lithographic image quality
    • C. Pierrat, A. Wong, and S. Vaidya, “Phase-shifting mask topography effects on lithographic image quality,” in IEDM Tech. Dig., 1992 pp. 53–56.
    • (1992) IEDM Tech. Dig. , pp. 53-56
    • Pierrat, C.1    Wong, A.2    Vaidya, S.3
  • 20
    • 0016544968 scopus 로고
    • Numerical solution of steady-state electromagnetic scattering problems using the time-dependent Maxwell's equations
    • Aug.
    • A. Taflove and M. E. Brodwin, “Numerical solution of steady-state electromagnetic scattering problems using the time-dependent Maxwell's equations,” IEEE Trans. Microwave Theory Tech., vol. MTT-23, pp. 623–630, Aug. 1975.
    • (1975) IEEE Trans. Microwave Theory Tech. , vol.MTT-23 , pp. 623-630
    • Taflove, A.1    Brodwin, M.E.2
  • 21
    • 0025590555 scopus 로고
    • Modeling latent-image formation in photolithography using the Helmholtz equation
    • H. Urbach, and D. Bernard, “Modeling latent-image formation in photolithography using the Helmholtz equation,” in Proc. SPIE, Opt./Laser Microlithography III, 1990, vol. 1264, pp. 278–293.
    • (1990) Proc. SPIE, Opt./Laser Microlithography III , vol.1264 , pp. 278-293
    • Urbach, H.1    Bernard, D.2
  • 26
    • 84894021661 scopus 로고
    • Numerical solution of initial boundary value problems involving Maxwell's equations in isotropic media
    • May
    • K. S. Yee, “Numerical solution of initial boundary value problems involving Maxwell's equations in isotropic media,” IEEE Trans. Antenn. Propagat., vol. AP-14, pp. 302–307, May 1966.
    • (1966) IEEE Trans. Antenn. Propagat. , vol.AP-14 , pp. 302-307
    • Yee, K.S.1
  • 27
    • 0025622227 scopus 로고
    • Photolithography simulation on nonplanar substrates
    • M. Yeung, “Photolithography simulation on nonplanar substrates,” in Proc. SPIE, Opt./Laser Microlithography III, 1990, vol. 1264, pp. 309–321.
    • (1990) Proc. SPIE, Opt./Laser Microlithography III , vol.1264 , pp. 309-321
    • Yeung, M.1
  • 28
    • 3543053315 scopus 로고
    • Improvement of the physical-optics approximation for topography simulation in optical lithography
    • M. Yeung and A. Neureuther, “Improvement of the physical-optics approximation for topography simulation in optical lithography,” in Proc. SPIE, Opt./Laser Microlithography VI, 1993, vol. 1927, pp. 833–846.
    • (1993) Proc. SPIE, Opt./Laser Microlithography VI , vol.1927 , pp. 833-846
    • Yeung, M.1    Neureuther, A.2
  • 29
    • 84950588572 scopus 로고
    • Modeling of optical alignment images for semiconductor structures
    • C. M. Yuan, J. Shaw, and W. Hopewell, “Modeling of optical alignment images for semiconductor structures,” in Proc. SPIE, Opt./Laser Microlithography II, 1989, vol. 1088, pp. 392–402.
    • (1989) Proc. SPIE, Opt./Laser Microlithography II , vol.1088 , pp. 392-402
    • Yuan, C.M.1    Shaw, J.2    Hopewell, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.