메뉴 건너뛰기




Volumn 42, Issue 10, 1995, Pages 1847-1854

A Behavioral Circuit Simulation Model for High-Power GaAs Schottky Diodes

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CIRCUIT THEORY; COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; POWER ELECTRONICS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; SWITCHING;

EID: 0029391695     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.464410     Document Type: Letter
Times cited : (14)

References (21)
  • 2
    • 84937654742 scopus 로고
    • Power rectifiers and thyristors
    • R. N. Hall, “Power rectifiers and thyristors,” in Proc. IRE, vol. 40, 1952, pp. 1512-1518.
    • (1952) Proc. IRE , vol.40 , pp. 1512-1518
    • Hall, R.N.1
  • 3
    • 0017970462 scopus 로고
    • Factors determining forward voltage drop in the field terminated diode (FTD)
    • M. S. Adler, “Factors determining forward voltage drop in the field terminated diode (FTD),” IEEE Trans. Electron Devices, vol. ED-25, pp. 529-536, 1978.
    • (1978) IEEE Trans. Electron Devices , vol.25 ED , pp. 529-536
    • Adler, M.S.1
  • 4
    • 84936896634 scopus 로고
    • Reverse recovery processes in silicon power rectifiers
    • H. Benda and E. Spenke, “Reverse recovery processes in silicon power rectifiers,” in Proc. IEEE, vol. 55, 1967, pp. 1331-1354.
    • (1967) Proc. IEEE , vol.55 , pp. 1331-1354
    • Benda, H.1    Spenke, E.2
  • 5
    • 0018523693 scopus 로고
    • New and unified model for Schottky barrier and III-V insulator interface states formation
    • Sept./Oct.
    • W. E. Spicer, P. W. Chye, P. R. Skeath, C. Y. Su, and I. Lindau, “New and unified model for Schottky barrier and III-V insulator interface states formation,” J Vac. Sci. Technoi, vol. 16, pp. 1422-1433, Sept./Oct. 1979.
    • (1979) J Vac. Sci. Technoi , vol.16 , pp. 1422-1433
    • Spicer, W.E.1    Chye, P.W.2    Skeath, P.R.3    Su, C.Y.4    Lindau, I.5
  • 6
    • 0024737721 scopus 로고
    • Optimum semiconductors for high-power electronics
    • Sept.
    • K. Shenai, R. S. Scott, and B. J. Baliga, “ Optimum semiconductors for high-power electronics,” IEEE Trans. Electron Devices, vol. 36, pp. 1811-1823, Sept. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1811-1823
    • Shenai, K.1    Scott, R.S.2    Baliga, B.J.3
  • 8
    • 0022046424 scopus 로고
    • Studies of turn-off effects in power semiconductor devices
    • B. E. Danielsson, “Studies of turn-off effects in power semiconductor devices,” Solid-State Electron., vol. 28, no. 4, pp. 375-391, 1985.
    • (1985) Solid-State Electron. , vol.28 , Issue.4 , pp. 375-391
    • Danielsson, B.E.1
  • 9
    • 0024144498 scopus 로고    scopus 로고
    • Modeling and simulation of power MOSFETs and power diodes
    • C. H. Xu and D. Schroder, “Modeling and simulation of power MOSFETs and power diodes,” in PESC ‘88 Rec, pp. 76-83.
    • PESC ‘88 Rec , pp. 76-83
    • Xu, C.H.1    Schroder, D.2
  • 10
    • 0025460811 scopus 로고
    • Diode forward and reverse recovery model for power electronic SPICE simulations
    • July
    • Y. C. Liang and V. J. Gosbell, “Diode forward and reverse recovery model for power electronic SPICE simulations,” IEEE Trans. Power Electron., vol. 5, no. 3, pp. 346-356, July 1990.
    • (1990) IEEE Trans. Power Electron. , vol.5 , Issue.3 , pp. 346-356
    • Liang, Y.C.1    Gosbell, V.J.2
  • 11
    • 0026141845 scopus 로고
    • A simple diode model with reverse recovery
    • Apr.
    • P. O. Lauritzen and C. L. Ma, “A simple diode model with reverse recovery,” IEEE Trans. Power Electron., vol. 6, no. 2, pp. 188-191, Apr. 1991.
    • (1991) IEEE Trans. Power Electron. , vol.6 , Issue.2 , pp. 188-191
    • Lauritzen, P.O.1    Ma, C.L.2
  • 12
    • 0002905465 scopus 로고
    • Theory of the boundary layer of crystal rectifiers
    • H. A. Bethe, “Theory of the boundary layer of crystal rectifiers,” MIT Radiation Lab. Rep. 43-12, 1942.
    • (1942) MIT Radiation Lab. Rep. , pp. 3-12
    • Bethe, H.A.1
  • 13
    • 0000065821 scopus 로고
    • Carrier transport across metal-semiconductor barriers
    • C. Y. Chang and S. M. Sze, “Carrier transport across metal-semiconductor barriers,” Solid-State Electron., vol. 13, pp. 727-740, 1970.
    • (1970) Solid-State Electron. , vol.13 , pp. 727-740
    • Chang, C.Y.1    Sze, S.M.2
  • 14
    • 0023999128 scopus 로고
    • Current transport mechanisms in atomically abrupt metal-semiconductor interfaces
    • Apr.
    • K. Shenai and R. W. Dutton, “Current transport mechanisms in atomically abrupt metal-semiconductor interfaces,” IEEE Trans. Electron Devices, vol. 35, no. 4, pp. 468-482, Apr. 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , Issue.4 , pp. 468-482
    • Shenai, K.1    Dutton, R.W.2
  • 15
    • 0000733563 scopus 로고
    • Minority carrier injection and charge storage in epitaxial Schottky barrier diodes
    • D. L. Scharfetter, “Minority carrier injection and charge storage in epitaxial Schottky barrier diodes,” Solid-State Electron., vol. 8, pp. 299-301, 1965.
    • (1965) Solid-State Electron. , vol.8 , pp. 299-301
    • Scharfetter, D.L.1
  • 17
    • 0020090520 scopus 로고
    • Metal-semiconductor contacts
    • Feb.
    • E. H. Rhoderick, “Metal-semiconductor contacts,” IEE Proc, vol. 129, pp. 1-4, Feb. 1982.
    • (1982) IEE Proc , vol.129 , pp. 1-4
    • Rhoderick, E.H.1
  • 19
    • 0011503539 scopus 로고
    • Thermionic emission in Au-GaAs Schottky barriers
    • F. A. Padovani, “Thermionic emission in Au-GaAs Schottky barriers,” Solid-State Electron., vol. 11, pp. 193-200, 1968.
    • (1968) Solid-State Electron. , vol.11 , pp. 193-200
    • Padovani, F.A.1
  • 21
    • 84939064607 scopus 로고    scopus 로고
    • SABER Users Manual
    • Beaverton, OR.
    • SABER Users Manual, Analogy Inc., Beaverton, OR.
    • Analogy Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.