-
2
-
-
84937654742
-
Power rectifiers and thyristors
-
R. N. Hall, “Power rectifiers and thyristors,” in Proc. IRE, vol. 40, 1952, pp. 1512-1518.
-
(1952)
Proc. IRE
, vol.40
, pp. 1512-1518
-
-
Hall, R.N.1
-
3
-
-
0017970462
-
Factors determining forward voltage drop in the field terminated diode (FTD)
-
M. S. Adler, “Factors determining forward voltage drop in the field terminated diode (FTD),” IEEE Trans. Electron Devices, vol. ED-25, pp. 529-536, 1978.
-
(1978)
IEEE Trans. Electron Devices
, vol.25 ED
, pp. 529-536
-
-
Adler, M.S.1
-
4
-
-
84936896634
-
Reverse recovery processes in silicon power rectifiers
-
H. Benda and E. Spenke, “Reverse recovery processes in silicon power rectifiers,” in Proc. IEEE, vol. 55, 1967, pp. 1331-1354.
-
(1967)
Proc. IEEE
, vol.55
, pp. 1331-1354
-
-
Benda, H.1
Spenke, E.2
-
5
-
-
0018523693
-
New and unified model for Schottky barrier and III-V insulator interface states formation
-
Sept./Oct.
-
W. E. Spicer, P. W. Chye, P. R. Skeath, C. Y. Su, and I. Lindau, “New and unified model for Schottky barrier and III-V insulator interface states formation,” J Vac. Sci. Technoi, vol. 16, pp. 1422-1433, Sept./Oct. 1979.
-
(1979)
J Vac. Sci. Technoi
, vol.16
, pp. 1422-1433
-
-
Spicer, W.E.1
Chye, P.W.2
Skeath, P.R.3
Su, C.Y.4
Lindau, I.5
-
6
-
-
0024737721
-
Optimum semiconductors for high-power electronics
-
Sept.
-
K. Shenai, R. S. Scott, and B. J. Baliga, “ Optimum semiconductors for high-power electronics,” IEEE Trans. Electron Devices, vol. 36, pp. 1811-1823, Sept. 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, pp. 1811-1823
-
-
Shenai, K.1
Scott, R.S.2
Baliga, B.J.3
-
8
-
-
0022046424
-
Studies of turn-off effects in power semiconductor devices
-
B. E. Danielsson, “Studies of turn-off effects in power semiconductor devices,” Solid-State Electron., vol. 28, no. 4, pp. 375-391, 1985.
-
(1985)
Solid-State Electron.
, vol.28
, Issue.4
, pp. 375-391
-
-
Danielsson, B.E.1
-
9
-
-
0024144498
-
Modeling and simulation of power MOSFETs and power diodes
-
C. H. Xu and D. Schroder, “Modeling and simulation of power MOSFETs and power diodes,” in PESC ‘88 Rec, pp. 76-83.
-
PESC ‘88 Rec
, pp. 76-83
-
-
Xu, C.H.1
Schroder, D.2
-
10
-
-
0025460811
-
Diode forward and reverse recovery model for power electronic SPICE simulations
-
July
-
Y. C. Liang and V. J. Gosbell, “Diode forward and reverse recovery model for power electronic SPICE simulations,” IEEE Trans. Power Electron., vol. 5, no. 3, pp. 346-356, July 1990.
-
(1990)
IEEE Trans. Power Electron.
, vol.5
, Issue.3
, pp. 346-356
-
-
Liang, Y.C.1
Gosbell, V.J.2
-
11
-
-
0026141845
-
A simple diode model with reverse recovery
-
Apr.
-
P. O. Lauritzen and C. L. Ma, “A simple diode model with reverse recovery,” IEEE Trans. Power Electron., vol. 6, no. 2, pp. 188-191, Apr. 1991.
-
(1991)
IEEE Trans. Power Electron.
, vol.6
, Issue.2
, pp. 188-191
-
-
Lauritzen, P.O.1
Ma, C.L.2
-
12
-
-
0002905465
-
Theory of the boundary layer of crystal rectifiers
-
H. A. Bethe, “Theory of the boundary layer of crystal rectifiers,” MIT Radiation Lab. Rep. 43-12, 1942.
-
(1942)
MIT Radiation Lab. Rep.
, pp. 3-12
-
-
Bethe, H.A.1
-
13
-
-
0000065821
-
Carrier transport across metal-semiconductor barriers
-
C. Y. Chang and S. M. Sze, “Carrier transport across metal-semiconductor barriers,” Solid-State Electron., vol. 13, pp. 727-740, 1970.
-
(1970)
Solid-State Electron.
, vol.13
, pp. 727-740
-
-
Chang, C.Y.1
Sze, S.M.2
-
14
-
-
0023999128
-
Current transport mechanisms in atomically abrupt metal-semiconductor interfaces
-
Apr.
-
K. Shenai and R. W. Dutton, “Current transport mechanisms in atomically abrupt metal-semiconductor interfaces,” IEEE Trans. Electron Devices, vol. 35, no. 4, pp. 468-482, Apr. 1988.
-
(1988)
IEEE Trans. Electron Devices
, vol.35
, Issue.4
, pp. 468-482
-
-
Shenai, K.1
Dutton, R.W.2
-
15
-
-
0000733563
-
Minority carrier injection and charge storage in epitaxial Schottky barrier diodes
-
D. L. Scharfetter, “Minority carrier injection and charge storage in epitaxial Schottky barrier diodes,” Solid-State Electron., vol. 8, pp. 299-301, 1965.
-
(1965)
Solid-State Electron.
, vol.8
, pp. 299-301
-
-
Scharfetter, D.L.1
-
17
-
-
0020090520
-
Metal-semiconductor contacts
-
Feb.
-
E. H. Rhoderick, “Metal-semiconductor contacts,” IEE Proc, vol. 129, pp. 1-4, Feb. 1982.
-
(1982)
IEE Proc
, vol.129
, pp. 1-4
-
-
Rhoderick, E.H.1
-
18
-
-
0001220823
-
Electric field dependence of GaAs Schottky barriers
-
G. H. Parker, T. C. McGill, C. A. Mead, and D. Hoffman, “Electric field dependence of GaAs Schottky barriers,” Solid-State Electron., vol. 11, pp. 201-204, 1968.
-
(1968)
Solid-State Electron.
, vol.11
, pp. 201-204
-
-
Parker, G.H.1
McGill, T.C.2
Mead, C.A.3
Hoffman, D.4
-
19
-
-
0011503539
-
Thermionic emission in Au-GaAs Schottky barriers
-
F. A. Padovani, “Thermionic emission in Au-GaAs Schottky barriers,” Solid-State Electron., vol. 11, pp. 193-200, 1968.
-
(1968)
Solid-State Electron.
, vol.11
, pp. 193-200
-
-
Padovani, F.A.1
-
21
-
-
84939064607
-
SABER Users Manual
-
Beaverton, OR.
-
SABER Users Manual, Analogy Inc., Beaverton, OR.
-
Analogy Inc.
-
-
|