The Influence of an LIGBT on CMOS Latch Up in Power Integrated Circuit

IEEE Transactions on Electron Devices

Volumn 42, Issue 10, 1995, Pages 1873-1874

  Huang, Alex Q ^a   Amaratunga, Gehan A J ^b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BIPOLAR TRANSISTORS; ELECTRIC CURRENTS; INTEGRATED CIRCUIT MANUFACTURE; POWER ELECTRONICS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR JUNCTIONS;

CMOS LATCH UP; LATERAL INSULATED GATE BIPOLAR TRANSISTORS; POWER DEVICE OPERATION; POWER INTEGRATED CIRCUIT; TRIGGERING CURRENTS/VOLTAGES;

CMOS INTEGRATED CIRCUITS;

EID: 0029391694     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.464404     Document Type: Article

References (6)

1. Q. Huang, G. A. J. Amaratunga, J. Humphrey, E. M. S. Narayanan, W. I. Milne, and C. M. Starbuck, “Monolithic integration of 5 V CMOS and high voltage devices,” IEEE Electron Device Lett., vol. 13, no. 11, pp. 575-577, 1992.
2. Q. Huang, G. A. J. Amaratunga, E. M. S. Narayanan, and W. I. Milne, “Static CMOS latch-up considerations in HVIC design,” IEEE J. Solid-State Circuits, vol. 25, no. 2, pp. 613-616, 1990.
3. T. P. Chow, D. N. Pattanayak, B. J. Baliga, M. S. Adler, W. A. Hennessy, and C. E. Logan, “Interaction between monolithic, junction-isolated lateral insulated gate bipolar transistors,” IEEE Trans. Electron Devices, vol. 38, no. 2, pp. 310-314, 1991.
4. A. Nakagawa, Y. Yamaguchi, T. Ogura, K. Watanabe, Y. Yasuhara, R. Sato, K. Endo, and K. Furukawa, “500 V three phase inverter ICs based on a new dielectric isolation technique,” in Proc. 4th Int. Symp. Power Semicon. Dev. & ICs, 1992, pp. 328-332.
5. M. Darwish and K. Board, “ Lateral resurfed COMFET,” Electron Lett., vol. 20, pp. 519-520, 1984.
6. W. M. Coughran, M. R. Pinto, and P. K. Smith, “Computation of steady state CMOS latch up characteristics,” IEEE Trans. Computer-Aided Design, vol. 7, pp. 307-323, 1988.