Noise Suppression Effect in an Avalanche Multiplication Photodiode Operating in a Charge Accumulation Mode

IEEE Transactions on Electron Devices

Volumn 42, Issue 10, 1995, Pages 1769-1774

  Ando, Takao ^a   Yasuda, Minoru ^a   Sawada, Kazuaki ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARGE COUPLED DEVICES; IMAGE SENSORS; IMAGING TECHNIQUES; INTEGRATED CIRCUIT TESTING; PHOTOCONDUCTIVITY; PHOTODETECTORS; PHOTOSENSITIVITY; SIGNAL TO NOISE RATIO; SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE;

AVALANCHE MULTIPLICATION PHOTO ELEMENT; CHARGE ACCUMULATION MODE; NOISE SUPPRESSION EFFECT; PIXEL CONFIGURATION; SOLID STATE IMAGERS;

PHOTODIODES;

EID: 0029391685     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.464420     Document Type: Letter

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