Calibration of optical lever sensitivity for atomic force microscopy

Review of Scientific Instruments

Volumn 66, Issue 10, 1995, Pages 5096-5097

  D'Costa, Neill P ^a   Hoh, Jan H ^a  

^a JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; LASERS; PHOTODIODES; SENSITIVITY ANALYSIS; VOLTAGE MEASUREMENT;

LASER SPOT; MICROSCOPE TIP; OPTICAL LEVER SENSITIVITY; SHIFT VOLTAGE;

OPTICAL DEVICES;

EID: 0029387634     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146135     Document Type: Article

References (6)