Opposite-Channel-Based Charge Injection in SOI MOSFET's Under Hot Carrier Stress

IEEE Transactions on Electron Devices

Volumn 42, Issue 9, 1995, Pages 1697-1700

  Zaleski, Andrzej ^a   Sinha, Shankar P ^a   Ioannou, Dimitris E ^a   Campisi, George J ^b   Hughes, Harold L ^b  

^a GEORGE MASON UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; COUPLED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC FIELDS; GATES (TRANSISTOR); HOT CARRIERS; SILICON ON INSULATOR TECHNOLOGY;

CHARGE INJECTION; HOT CARRIER STRESS; OPPOSITE-CHANNEL-BASED CHARGE INJECTION; PISCES SIMULATION;

MOSFET DEVICES;

EID: 0029379446     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.405288     Document Type: Article

References (13)

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