Impedance spectroscopy of grain boundaries in nanophase ZnO

Journal of Materials Research

Volumn 10, Issue 9, 1995, Pages 2295-2300

  Siegel, R W ^c   Mashek, J J ^b   Mason, T O ^b  

^a UNIVERSITY OF NOTRE DAME   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CONDENSATION; CRYSTAL DEFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC IMPEDANCE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; OXYGEN SENSORS; POWDERS; SINTERING; THERMAL EFFECTS;

GAS CONDENSATION TECHNIQUE; NANOPHASE ZINC OXIDE;

ZINC OXIDE;

EID: 0029379292     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1995.2295     Document Type: Article

References (29)

1. H. Gleiter in Deformation of Polycrystals: Mechanisms and Microstructures, edited by N. Hansen, A. Horsewell, T. Leffers and H. Lilholt (RisϘ National Laboratory, Roskilde, 1981). p. 15.
2. R. Birringer H. Gleiter H.P. Klein, and P. Marquardt Phys. Lett. 102A, 365 (1984).
3. R. Birringer U. Herr and H. Gleiter Suppl. Trans. Jpn. Inst. Met. 27, 43 (1986).
4. R.W. Siegel, S. Ramasamy, H. Hahn Li Zongquan, Lu Ting, and R. Gronsky J. Mater. Res. 3, 1367 (1988).
5. R.W. Siegel and J.A. Eastman in Multicomponent Ultrafine Microstructures, edited by L.E. Mc Candlish, D.E. Polk, R.W. Siegel, and B.H. Kear (Mater. Res. Soc. Symp. Proc. 132, Pittsburgh, PA, 1989), p. 3.
6. M. J. Mayo R.W. Siegel, Y. X. Liao and W.D. Nix, J. Mater. Res. 7, 973 (1992).
7. H. Hahn, J. Logas and R. S. Averback J. Mater. Res. 5, 609 (1990).
8. K. Kimoto Y. Kamiya M. Nonoyama and R. Uyeda Jpn. J. Appl. Phys. 2, 702 (1963).
9. C.G. Granqvist and R.A. Buhrman, J. Appl. Phys. 47, 2200 (1976).
10. A.R. Thälen, Acta Metall. 27, 1765 (1979).
11. R.W. Siegel, Mater. Sci. Eng. A 168, 189 (1993).
12. H. Hahn, J.C. Logas H.J. Höfler, and R.S. Averback in Clusters and Cluster-Assembled Materials, edited by R.S. Averback D.L. Nelson and J. Bemholc (Mater. Res. Soc. Symp. Proc. 206, Pittsburgh, PA, 1991), p. 569.
13. Y.K. Huang A.A. Menovsky and F.R. De Boer, Nanostructured Materials 2, 505 (1993).
14. T. Takeuchi K. Ado T. Asai H. Kageyama Y. Saito C. Masquelier and O. Nakamura J. Am. Ceram Soc. 77, 1665 (1994).
15. T.K. Gupta, J. Am. Ceram. Soc. 73, 1817 (1990).
16. F.A. Kröger, Chemistry of Imperfect Crystals, 2nd ed. (North-Holland, Amsterdam, 1974).
17. K.I. Hagemark, J. Solid State Chem. 16, 293 (1976).
18. G.D. Mahan, J. Appl. Phys. 54, 3825 (1976).
19. R. Eizinger in Grain Boundaries in Semiconductors, edited by H. J. Leamy G. E. Pike and C. H. Seager (Elsevier, New York, 1982), p. 342.
20. J.R. Macdonald, Impedance Spectroscopy: Emphasizing Solid Materials and Systems (Wiley, New York, 1987).
21. E. Ziegler A. Heinrich H. Opperman and G. Stover Phys. Status Solidi A 66, 635 (1981).
22. G. Heiland E. Mollwo and F. Stockman in Solid State Physics, edited by F. Seitz and D. Turnbull (Academic Press, New York, 1959), p. 191.
23. G. E. Pikes S. R. Kurtz and P. L. Dourly J. Appl. Phys. 57, 5512 (1985).
24. G. Blatter and F. Greuter Phys. Rev. B 33, 3952 (1986).
25. M. Seitz F. Hampton and W. Richmond in Advances in Ceramics, edited by M. F. Yan and A. H Heuer (American Ceramic Society, Westerville, OH, 1983), p. 60.
26. H.H.V. Baumbach and C. Wagner Z. Phys. Chem. B 22, 199 (1933).
27. M. H. Sukkar and H.L. Tuller, in Advances in Ceramics, edited by M. F. Yan and A. H. Heuer (American Ceramic Society, Westerville, OH, 1983), p. 71.
28. C. Gleiter J. Nowotny and M. Rekas Appl. Phys. A 53, 310 (1991).
29. V. S. Stubican Philos. Mag. A 68, 809 (1993).