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Volumn 26, Issue 9, 1995, Pages 2207-2217
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The effect of trace additions of sn on precipitation in Al-Cu alloys: An atom probe field ion microscopy study
a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
ADDITION REACTIONS;
AGING OF MATERIALS;
ATOMS;
ELECTRON DIFFRACTION;
GRAIN BOUNDARIES;
MICROSCOPIC EXAMINATION;
NUCLEATION;
PHASE INTERFACES;
PRECIPITATION (CHEMICAL);
SEGREGATION (METALLOGRAPHY);
TIN;
TRANSMISSION ELECTRON MICROSCOPY;
ALUMINUM COPPER TIN ALLOYS;
ATOM PROBE ANALYSIS;
ATOM PROBE FIELD ION MICROSCOPY;
MICROBEAM ELECTRON DIFFRACTION;
ALUMINUM ALLOYS;
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EID: 0029378547
PISSN: 10735623
EISSN: 15431940
Source Type: Journal
DOI: 10.1007/BF02671236 Document Type: Article |
Times cited : (140)
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References (39)
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