A Voltage Dependent Capacitance Model Including Effects of Manufacturing Process Variabilities on Voltage Coefficients

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 14, Issue 9, 1995, Pages 1093-1097

  Ito, Akira ^a  

^a INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; INTEGRATED CIRCUIT MANUFACTURE; MONTE CARLO METHODS; POLYNOMIALS; SEMICONDUCTOR DEVICE MODELS; VOLTAGE CONTROL;

POLYSILICON/OXIDE/POLYSILICON CAPACITOR; VOLTAGE COEFFICIENTS; VOLTAGE DEPENDENT CAPACITANCE MODEL;

INTEGRATED CIRCUIT LAYOUT;

EID: 0029378201     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.406711     Document Type: Article

References (9)

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