Preparation and first measurements of TBCCO thin film intrinsic stacked Josephson junctions

Superconductor Science and Technology

Volumn 8, Issue 9, 1995, Pages 740-743

  Schmidl, F ^a   Pfuch, A ^a   Schneidewind, H ^a   Heinz, E ^a   Dorrer, L ^a   Matthes, A ^a   Seidel, P ^a   Hubner, U ^b   Veith, M ^b   Steinbeiss, E ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT CONTACT; HIGH TEMPERATURE THIN FILM; INTRINSIC STARKED JOSEPHSON JUNCTION; SUPERCONDUCTING BASE ELECTRODE; THALLIUM BISMUTH CALCIUM CUPRATE; VOLTAGE CONTACT;

ELECTRIC CONTACTS; ELECTRODES; HIGH TEMPERATURE SUPERCONDUCTORS; JOSEPHSON JUNCTION DEVICES; OXIDE SUPERCONDUCTORS; SINGLE CRYSTALS; TITANIUM COMPOUNDS;

SUPERCONDUCTING FILMS;

EID: 0029374016     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/8/9/007     Document Type: Article

References (11)

1. Josephson coupling and anisotropy in lead-substituted bismuth cuprates
2. Intrinsic Josephson tunnel junctions fabricated on the surfaces of Bi2212 single crystals by photolithography