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Japanese Journal of Applied Physics

Volumn 34, Issue 9R, 1995, Pages 4765-4769

Characterization of interdiffusion in srТioз/yВа2СuзО7-x multilayers by in situ auger electron spectroscopy

(2) Nakamura, Takao a Iiyama, Michitomo a

a SUMITOMO ELECTRIC INDUSTRIES LTD (Japan)

Author keywords

Activation energy; Auger electron spectroscopy; Field effect; MBE interdiffusion; Sr iO ; Y 2 u 7 x

Indexed keywords

ACTIVATION ENERGY; ATOMS; AUGER ELECTRON SPECTROSCOPY; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STRONTIUM COMPOUNDS; SURFACE STRUCTURE; YTTRIUM COMPOUNDS;

ANNEALING TEMPERATURE; DOUBLE PASS CYLINDRICAL MIRROR ANALYZER; IN SITU AUGER ELECTRON SPECTROSCOPY; IN SITU REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; OZONE ASSISTED MOLECULAR BEAM EPITAXY METHOD; PULSED LASER DEPOSITION;

MULTILAYERS;

EID: 0029370694 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.34.4765 Document Type: Article

Times cited : (10)

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