SCOPUS 정보 검색 플랫폼

Volumn 14, Issue 3, 1995, Pages 149-167

Techniques for depth-selective, low-frequency eddy current analysis for SQUID-based nondestructive testing

Author keywords

deep flaws; Eddy current; phase analysis; sheet inducers; SQUID magnetometer

Indexed keywords

ALUMINUM SHEET; CRACKS; CURRENT DENSITY; EDDY CURRENTS; MAGNETIC FIELDS; MAGNETOMETERS; MATHEMATICAL MODELS; SQUIDS; SURFACES;

DEEP FLAWS; SHEET INDUCERS;

NONDESTRUCTIVE EXAMINATION;

EID: 0029369709 PISSN: 01959298 EISSN: 15734862 Source Type: Journal
DOI: 10.1007/BF03219935 Document Type: Article

Times cited : (15)

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