Transient measurements of heat distribution in devices fabricated on silicon-on-diamond material

Japanese Journal of Applied Physics

Volumn 34, Issue 9R, 1995, Pages 4709-4714

  Johansson, Erik ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

Diamond; Self heating; Silicon; Silicon on diamond; SOD; SOI; Temperature measurement; Thermal properties

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SILICA; SILICON ON INSULATOR TECHNOLOGY; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY; THERMODYNAMIC PROPERTIES;

HEAT DISTRIBUTION; POLYCRYSTALLINE DIAMOND FILMS; SILICON ON DIAMOND STRUCTURE; THERMAL COEFFICIENT; TRANSIENT MEASUREMENT;

SEMICONDUCTING DIAMONDS;

EID: 0029368377     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.34.4706     Document Type: Article

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