SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 60, Issue 2, 1995, Pages 311-323

Measurement of low-order structure factors for silicon from zone-axis CBED patterns

(6) Saunders, M a Bird, D M a Zaluzec, N J b Burgess, W G c Preston, A R c Humphreys, C J c

a UNIVERSITY OF BATH (United Kingdom)

b ARGONNE NATIONAL LABORATORY (United States)

c UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; CALCULATIONS; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; DETECTORS; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; SILICON; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAYS;

AUTOMATED PATTERN MATCHING; CCD DETECTORS; DATA EXTRACTION; ENERGY FILTERS; INTENSITIES; LOW-ORDER STRUCTURE FACTORS; METHOD OF EXTRACTING; PATTERN ANALYSIS; X-RAY MEASUREMENT;

ELECTRON DIFFRACTION;

ARTICLE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY;

EID: 0029360401 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/0304-3991(95)00058-1 Document Type: Article

Times cited : (58)

References (18)

1
- 0003464779
- Plenum, New York
- (1992) Electron Microdiffraction
- Spence¹ Zuo²

2
- 0026928571
- (1992) Ultramicroscopy , vol.45 , pp. 241
- Bird¹ Saunders²

3
- 0028437065
- (1994) Ultramicroscopy , vol.54 , pp. 15
- Deininger¹ Necker² Mayer³

4
- 0027540619
- (1993) Ultramicroscopy , vol.49 , pp. 159
- Hoier¹ Marthinsen² Holmestad³

5
- 0000925963
- The Electron Distribution in Silicon. I. Experiment
- (1973) Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences , vol.332 , pp. 223
- Aldred¹ Hart²

6
- 84916568915
- (1973) Proc. R. Soc. London (A) , vol.332 , pp. 234
- Aldred¹ Hart²

7
- 4243289930
- P Swann et al., Academic Press, New York
- (1974) High-Voltage Electron Microscopy
- Hewat¹ Humphreys²

8
- 0001516126
- (1993) Phys. Rev. B , vol.47 , Issue.15 , pp. 9385
- Lu¹ Zunger² Deutsch³

9
- 0002426482
- (1992) Physics World , vol.5 , Issue.11 , pp. 35
- Paxton¹

10
- 84916589974
- University of Bath, UK
- (1994) PhD Thesis
- Saunders¹

11
- 0004240547
- Academic Press, London
- (1981) Practical Optimization
- Gill¹ Murray² Wright³

12
- 84980074290
- Relativistic Hartree–Fock X-ray and electron scattering factors
- (1968) Acta Crystallographica Section A , vol.24 , pp. 390
- Doyle¹ Turner²

13
- 84883166724
- Absorptive form factors for high-energy electron diffraction
- (1990) Acta Crystallographica Section A Foundations of Crystallography , vol.46 , pp. 202
- Bird¹ King²

14
- 0001640989
- (1972) Solid State Commun. , vol.10 , pp. 159
- Shah¹ Straumanis²

15
- 0001281290
- (1993) Inst. Phys. Conf. Ser. , vol.138 , pp. 141
- Holmestad¹ Weickenmeier² Zuo³ Spence⁴ Horita⁵

16
- 84916568914
- Paris, Les Editions de Physique, Les Ulis, France
- (1994) Proc. ICEM 13
- Saunders¹ Midgley² Vincent³

17
- 84916568914
- Paris, Les Editions de Physique, Les Ulis, France
- (1994) Proc. ICEM 13
- Saunders¹ Bird² Midgley³ Vincent⁴

18
- 0029151441
- Proc. EELSI 94
- Leukerbad
- (1995) Ultramicroscopy , vol.59 , pp. 1
- Midgley¹ Saunders² Vincent³ Steeds⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.