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Volumn 42, Issue 8, 1995, Pages 1528-1535

Effects of Measurement Frequency and Temperature Anneal on Differential Gate Capacitance Spectra Observed in Hot Carrier Stressed MOSFET's

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITANCE MEASUREMENT; ELECTRIC FREQUENCY MEASUREMENT; ENERGY GAP; GATES (TRANSISTOR); HOT CARRIERS; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; TEMPERATURE MEASUREMENT;

EID: 0029359211     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.398669     Document Type: Article
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.