Limitation of CMOS Supply-Voltage Scaling by MOSFET Threshold-Voltage Variation

IEEE Journal of Solid-State Circuits

Volumn 30, Issue 8, 1995, Pages 947-949

  Sun, Shih Wei ^a   Tsui, Paul G Y ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; MOSFET DEVICES; OSCILLATORS (ELECTRONIC); SENSITIVITY ANALYSIS; STATISTICAL METHODS; VOLTAGE CONTROL;

CHANNEL LENGTH VARIATION; CIRCUIT SPEED SCATTERING; CMOS SUPPLY VOLTAGE SCALING; EMPIRICAL POWER LAW RELATIONSHIP; LOGIC TECHNOLOGY; RING OSCILLATOR PROPAGATION DELAY; THRESHOLD VOLTAGE VARIATION;

CMOS INTEGRATED CIRCUITS;

EID: 0029358972     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.400439     Document Type: Article

References (7)

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