Noise Measurements of Microwave Transistors Using an Uncalibrated Mechanical Stub Tuner and a Built-in Reverse Six-Port Reflectometer

IEEE Transactions on Instrumentation and Measurement

Volumn 44, Issue 4, 1995, Pages 847-852

  Lê, Di Luân ^a   Ghannouchi, Fadhel M ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CALCULATIONS; ELECTRIC IMPEDANCE; ELECTRONIC EQUIPMENT; MICROWAVE DEVICES; REFLECTOMETERS; SEMICONDUCTING GALLIUM ARSENIDE; SIGNAL TO NOISE RATIO; THERMAL VARIABLES CONTROL; TRANSISTORS; TUNERS;

BOLTZMAN CONSTANT; BUILT IN REVERSE SIX PORT REFLECTOMETER; THERMALLY CONTROLLED ELECTRONIC TUNER; UNCALIBRATED MECHANICAL STUB TUNER;

SIGNAL NOISE MEASUREMENT;

EID: 0029358331     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.392869     Document Type: Article

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