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Volumn 44, Issue 4, 1995, Pages 843-846
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Temporal Measurement of Plasma Density Variations Above a Semiconductor Bridge (SCB)
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
CAPACITORS;
CAVITY RESONATORS;
ELECTRIC CONDUCTIVITY;
ELECTRIC CONTACTS;
IONS;
MICROWAVE DEVICES;
NUMERICAL ANALYSIS;
SEMICONDUCTING FILMS;
SEMICONDUCTOR DEVICES;
VACUUM;
CAPACITOR DISCHARGE FIRING SET;
LANGMUIR PROBE MEASUREMENT;
MICROWAVE RESONATOR;
PLASMA TRANSPORT;
SEMICONDUCTOR BRIDGE DEVICES;
PLASMA DENSITY;
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EID: 0029357666
PISSN: 00189456
EISSN: 15579662
Source Type: Journal
DOI: 10.1109/19.392868 Document Type: Article |
Times cited : (12)
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References (6)
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