Atomically resolved inp(110) surface observed with noncontact ultrahigh vacuum atomic force microscope

Japanese Journal of Applied Physics

Volumn 34, Issue 8, 1995, Pages L1086-L1088

  Ueyama, Hitoshi ^a   Ohta, Masahiro ^a   Sugawara, Yasuhiro ^a   Morita, Seizo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Atomic defect; Atomic force microscope; FM detection; InP; Noncontact; True atomic resolution; Ultrahigh vacuum

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; FREQUENCY MODULATION; INTERFEROMETERS; NATURAL FREQUENCIES; SURFACES; VACUUM APPLICATIONS; VIBRATIONS (MECHANICAL);

CLEAVAGE; FORCE GRADIENT; TRUE ATOMIC RESOLUTION; VIBRATION AMPLITUDE;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0029356962     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.34.L1086     Document Type: Article

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