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physica status solidi (a)

Volumn 150, Issue 2, 1995, Pages 613-624

Scanning electron microscopical inspection of uncoated CaF2 single crystals

(4) Johansen, H a Gogoll, S b Stenzel, E b Reichling, M b

a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

b FREIE UNIVERSITÄT BERLIN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CALCIUM COMPOUNDS; ELECTRIC CHARGE; ELECTRON SCATTERING; IMAGE ANALYSIS; INSPECTION; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; SURFACES;

CALCIUM FLUORIDE SINGLE CRYSTALS; CHARGE-UP PROPERTIES; ELECTRON IMAGING; ELECTRON TRAPPING; IMAGE SHIFT; SCANNING ELECTRON MICROSCOPICAL INSPECTION; SURFACE CHARGE;

SINGLE CRYSTALS;

EID: 0029354505 PISSN: 00318965 EISSN: 1521396X Source Type: Journal
DOI: 10.1002/pssa.2211500205 Document Type: Article

Times cited : (8)

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