Spectrum analysis of recorded magnetization using magnetic force microscopy

Japanese Journal of Applied Physics

Volumn 34, Issue 8, 1995, Pages L987-L990

  Honda, Yukio ^a   Inaba, Nobuyuki ^a   Tomiyama, Futoshi ^a   Yamamoto, Tomoo ^a   Futamoto, Masaaki ^a  

^a HITACHI LTD   (Japan)

Author keywords

Longitudinal recording medium; Magnetic force microscope; Magnetization structure; Noise characteristics; Spectrum analysis

Indexed keywords

CHROMIUM; COBALT ALLOYS; FOURIER TRANSFORMS; IMAGE ANALYSIS; MAGNETIC RECORDING; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; STRUCTURE (COMPOSITION); TANTALUM; THIN FILMS;

COPPER CHROMIUM TANTALUM THIN FILM; FREQUENCY CHARACTERISTICS; LONGITUDINAL RECORDING MEDIUM; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION STRUCTURE; MEDIUM NOISE; NOISE CHARACTERISTICS; SPIN-POLARIZED SCANNING ELECTRON MICROSCOPY;

MAGNETIZATION;

EID: 0029354329     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.34.L987     Document Type: Article

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