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Volumn 23, Issue 4, 1995, Pages 573-580

Two-Dimensional Simulation of Polysilicon Etching with Chlorine in a High Density Plasma Reactor

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHLORINE; DISSOCIATION; ELECTRIC REACTORS; ELECTRODES; ELECTROMAGNETIC FIELD THEORY; ETCHING; MAXWELL EQUATIONS; PLASMA DENSITY; PLASMA SIMULATION; SILICON;

EID: 0029352780     PISSN: 00933813     EISSN: 19399375     Source Type: Journal    
DOI: 10.1109/27.467977     Document Type: Article
Times cited : (72)

References (14)
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  • 7
    • 84936898663 scopus 로고    scopus 로고
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    • M. Surendra, “Radiofrequency discharge benchmark model comparison,” Plasma Sources Sci. Technol., to appear
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  • 8
    • 0001460896 scopus 로고
    • Fluid simulations of glow discharges: Effect of metastable atoms in argon
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  • 9
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.