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Volumn 31, Issue 15, 1995, Pages 1221-1222

Practical DfT strategy for fault diagnosis inactive analogue filters

Author keywords

Active fillers; Analogue circuits; Design for testability; Fault diagnosis; Filters

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; MOSFET DEVICES; OPERATIONAL AMPLIFIERS; PERTURBATION TECHNIQUES; SWITCHES; TRANSFER FUNCTIONS;

EID: 0029345611     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19950883     Document Type: Article
Times cited : (11)

References (10)
  • 1
    • 3643102946 scopus 로고
    • Design for testability for mixed analog/digital ASICs
    • Custom Integr. Circ. Conf., 1988
    • FASANG, P.P., MULLINS, D., and WONG, T.: ‘Design for testability for mixed analog/digital ASICs’. Proc. IEEE 1988 Custom Integr. Circ. Conf., 1988, pp. 16.5.1-16.5.4
    • (1988) Proc. IEEE , pp. 16.5.1-16.5.4
    • FASANG, P.P.1    MULLINS, D.2    WONG, T.3
  • 2
    • 0024124547 scopus 로고
    • Design for testability of mixed- signal integrated circuits
    • Int. Test Conf., 1988
    • WAGNER, K.D., and WILLIAMS, T.W.: ‘Design for testability of mixed- signal integrated circuits’. Proc. IEEE 1988 Int. Test Conf., 1988, pp. 823-828
    • (1988) Proc. IEEE , pp. 823-828
    • WAGNER, K.D.1    WILLIAMS, T.W.2
  • 3
    • 0025448207 scopus 로고
    • Built-in self-test (BIST) structure for analog circuit fault diagnosis
    • WEY, C.L.: ‘Built-in self-test (BIST) structure for analog circuit fault diagnosis’, IEEE Trans. Instrum. Meas., 1990, 39, pp. 517-521
    • (1990) IEEE Trans. Instrum. Meas. , vol.39 , pp. 517-521
    • WEY, C.L.1
  • 4
    • 3843102825 scopus 로고
    • Block-oriented test strategy for analog circuits
    • SCHAFER, G., SAPOTTA. H., and DENNER, W.: ‘Block-oriented test strategy for analog circuits’. Proc. ESSCIRC, 1991, pp. 217-220
    • (1991) Proc. ESSCIRC , pp. 217-220
    • SCHAFER, G.1    SAPOTTA, H.2    DENNER, W.3
  • 5
    • 0027698623 scopus 로고
    • Improving the testability of switched-capacitor filters
    • HUERTAS, J.L., RUEDA, A., and VAZQUEZ, D.: ‘Improving the testability of switched-capacitor filters’, J. Electron.Test., Theory Appl., 1993, 4, (4), pp. 299-313
    • (1993) J. Electron.Test., Theory Appl. , vol.4 , Issue.4 , pp. 299-313
    • HUERTAS, J.L.1    RUEDA, A.2    VAZQUEZ, D.3
  • 7
    • 0002155708 scopus 로고
    • Hybrid built-in self-test (HBIST) for mixed analogue/digital integrated circuits
    • OHLETZ, M.: ‘Hybrid built-in self-test (HBIST) for mixed analogue/digital integrated circuits’. Proc. Europ. Test Conf., 1991, pp. 307- 316
    • (1991) Proc. Europ. Test Conf. , pp. 307-316
    • OHLETZ, M.1
  • 8
    • 0025479316 scopus 로고
    • A design-for-test methodology for active analog filters
    • SOMA, M.: ‘A design-for-test methodology for active analog filters’. Proc. IEEE Int. Test Conf., 1990, pp. 183-192
    • (1990) Proc. IEEE Int. Test Conf. , pp. 183-192
    • SOMA, M.1
  • 9
    • 0028756093 scopus 로고
    • A design-for-test technique for switched-capacitor filters
    • SOMA, M., and KOLARIK, V.: ‘A design-for-test technique for switched-capacitor filters’. Proc. IEEE VLSI Test Symp., 1994, pp. 42-47
    • (1994) Proc. IEEE VLSI Test Symp. , pp. 42-47
    • SOMA, M.1    KOLARIK, V.2
  • 10
    • 0027909754 scopus 로고
    • Design-for-test structure to facilitate test vector application with low performance loss in nontest mode
    • BRATT, A.H., HARVEY, R.J., DOREY, A.P., and RICHARDSON, A.M.D.: ‘Design-for-test structure to facilitate test vector application with low performance loss in nontest mode’. Electron. Lett., 1993. 29, (16), pp. 1438-1440
    • (1993) Electron. Lett. , vol.29 , Issue.16 , pp. 1438-1440
    • BRATT, A.H.1    HARVEY, R.J.2    DOREY, A.P.3    RICHARDSON, A.M.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.