Progress of High-Resolution Photon Scanning Tunneling Microscopy Due to a Nanometric Fiber Probe

Journal of Lightwave Technology

Volumn 13, Issue 7, 1995, Pages 1200-1221

  Ohtsu, Motoichi ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC WAVEGUIDES; ETCHING; FIBER OPTIC SENSORS; IMAGING TECHNIQUES; LIGHT POLARIZATION; OPTICAL FIBERS; OPTICAL WAVEGUIDES; PHOTOLITHOGRAPHY; PHOTONS; SEMICONDUCTOR QUANTUM DOTS; THIN FILMS; TRANSFER FUNCTIONS;

COLLECTION MODE; ELECTROMAGNETIC INTERACTION; ILLUMINATION MODE GEOMETRIES; LITHIUM TANTALUM OXIDE; NANOMETRIC FIBER PROBE; PHOTON SCANNING TUNNELING MICROSCOPY;

SCANNING TUNNELING MICROSCOPY;

EID: 0029342175     PISSN: 07338724     EISSN: 15582213     Source Type: Journal    
DOI: 10.1109/50.400696     Document Type: Article

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