Structural and morphological characterization of high quality Y1Ba2Cu3Ox epitaxial films by atomic force and high resolution scanning electron microscopies

Cryogenics

Volumn 35, Issue 6, 1995, Pages 361-366

  Alvarez, G A ^a   Matsuda, M ^a,b   Koyanagi, M ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b MURORAN INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

atomic force microscopy; high resolution scanning electron microscopy; YBCO film characterization

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; EPITAXIAL GROWTH; FILM GROWTH; MAGNESIA; MORPHOLOGY; OXIDE SUPERCONDUCTORS; PULSED LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); SUPERCONDUCTIVITY; SURFACES;

FLUX PINNING; SURFACE TOPOGRAPHY;

SUPERCONDUCTING FILMS;

EID: 0029328202     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/0011-2275(95)99815-P     Document Type: Article

References (17)

1. The properties and observation of dislocations
2. The Growth of Crystals and the Equilibrium Structure of their Surfaces
3. Phänomenologische Theorie der Kristallabscheidung an Oberflächen. I