Integration of Step-edge Grain Boundary Josephson Junctions with YBCO Multilayers for Electronics Applications

IEEE Transactions on Applied Superconductivity

Volumn 5, Issue 2, 1995, Pages 3131-3134

  Daly, Kenneth P ^a   Murduck, James M ^a   Pettiette Hall, Claire L ^a   Sergant, Moshe ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; DEFECTS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC WIRING; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; MULTILAYERS; PHOTOLITHOGRAPHY; PHOTORESISTS; SQUIDS; YTTRIUM COMPOUNDS;

DIELECTRIC DEFECT DENSITY; ELECTRONIC APPLICATIONS; JUNCTION CRITICAL CURRENT UNIFORMITY; STEP EDGE JUNCTION; WIRING LAYER CRITICAL CURRENT;

JOSEPHSON JUNCTION DEVICES;

EID: 0029327551     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.403255     Document Type: Article

References (6)

1. C. L. Pettiette-Hall, J. A. Luine, J. F. Burch, R. Hu, J. Sergant, and D. S. John, “YBCO Step-edge Junctions on Various Substrates,” to be published in IEEE Trans. Applied Superconductivity, March 1995.
2. Alfred E. Lee, Jerome A. Luine, Claire L. Pettiete-Hall, “Co-doped-YBCO SNS Junctions for Superconductive Integrated Circuits,” to be published in IEEE Trans. Applied Superconductivity, March 1995.
3. S.P.I. Supplies, PO Box 656, Westchester, PA 19381, part number 05070-AB
4. S.M. Sze, VLSI Technology, McGraw-Hill, 1983, p. 604.
5. N. Missert, T.E. Harvey, R.H. Ono, C.D. Reinstsema, “High-Tc multilayer step-edge Josephson junctions and SQUIDs,” Applied Physics Letters, vol 63, 1690, September 1993.
6. A.Z. Kain, C.L. Pettiette-Hall, K.P. Daly, A.E. Lee, R. Hu and J.F. Burch, “Dielectric Properities of SrTi03 Thin Films at Low Temperature,” IEEE Trans. Applied Superconductivity, vol 3, 1993, 1421.