An Optoelectronic Testing System of Rapid, Single-Flux Quantum Circuits

IEEE Transactions on Applied Superconductivity

Volumn 5, Issue 2, 1995, Pages 2849-2852

  Currie, Marc ^a   Wang, Chia Chi ^a   Jacobs Perkins, Douglas ^a   Sobolewski, Roman ^a   Hsiang, Thomas Y ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIODES; ELECTRIC VARIABLES MEASUREMENT; FILM PREPARATION; JOSEPHSON JUNCTION DEVICES; METALLIZING; MICROSTRIP LINES; OPTOELECTRONIC DEVICES; PHOTOCONDUCTING DEVICES; SUPERCONDUCTING ELECTRIC LINES;

ELECTRICAL PULSE GENERATION; FAILURE MODE TESTING; JOSEPHSON JUNCTION PULSE SHAPER; JOSEPHSON TRANSMISSION LINE; METAL SEMICONDUCTOR METAL DIODES; OPTOELECTRONIC SWITCH; OPTOELECTRONIC TESTING SYSTEM; REFLECTIVE ELECTROOPTIC SAMPLING SYSTEM; SINGLE FLUX QUANTUM CIRCUITS; SUPERCONDUCTING MICROSTRIP LINES;

LOGIC CIRCUITS;

EID: 0029327030     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.403185     Document Type: Article

References (9)

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