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Volumn 375, Issue 6534, 1995, Pages 767-769
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The signature of conductance quantization in metallic point contacts
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELECTRIC CURRENTS;
ELECTRIC FIELD EFFECTS;
ELECTRODES;
ELECTRONIC PROPERTIES;
ELECTRONS;
LOW TEMPERATURE OPERATIONS;
POINT CONTACTS;
SEMICONDUCTOR DEVICES;
SODIUM;
THREE DIMENSIONAL;
VACUUM APPLICATIONS;
CONDUCTANCE QUANTIZATION;
ELECTRON GAS;
METALLIC POINT CONTACTS;
TWO DIMENSIONAL;
TWO LEVEL FLUCTUATIONS;
ELECTRIC RESISTANCE MEASUREMENT;
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EID: 0029326440
PISSN: 00280836
EISSN: None
Source Type: Journal
DOI: 10.1038/375767a0 Document Type: Article |
Times cited : (563)
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References (18)
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