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Volumn 47, Issue 6, 1995, Pages 31-35

Characterizing the temperature dependence of electronic packaging-material properties

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; CHARACTERIZATION; COMPUTER CONTROL; DEFORMATION; ELASTIC MODULI; FINITE ELEMENT METHOD; GLASS FIBER REINFORCED PLASTICS; PRINTED CIRCUIT BOARDS; STRAIN GAGES; STRAIN MEASUREMENT; THERMAL EFFECTS; THERMOANALYSIS;

EID: 0029325205     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/BF03221201     Document Type: Article
Times cited : (16)

References (13)
  • 5
    • 0026170928 scopus 로고
    • Transient Thermal Stress Analysis of a Plated Through Hole Subjected to Wave Soldering
    • (1991) JOM , vol.113 , Issue.2 , pp. 149-155
    • Barkar, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.