Performance of Josephson Array Systems Related to Fabrication Techniques and Design

IEEE Transactions on Applied Superconductivity

Volumn 5, Issue 2, 1995, Pages 2903-2906

  Muller, F ^a   Kohlmann, J ^a   Hebrank, F X ^a   Weimann, T ^a   Wolf, H ^a   Niemeyer, J ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; CURRENT DENSITY; DEPOSITION; ELECTRIC VARIABLES MEASUREMENT; FABRICATION; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; MICROWAVE CIRCUITS; PHOTOLITHOGRAPHY; SILICA; SILICON WAFERS; TUNNEL JUNCTIONS;

ATTENUATION MEASUREMENT; JOSEPHSON ARRAY SYSTEMS; JOSEPHSON STRIPLINE; JOSEPHSON TUNNEL JUNCTIONS; MICROWAVE ATTENUATION; TRAPPED FLUX; TRILAYER TECHNIQUE; VOLTAGE STANDARD CHIPS;

JOSEPHSON JUNCTION DEVICES;

EID: 0029324734     PISSN: 10518223     EISSN: 15582515     Source Type: Journal    
DOI: 10.1109/77.403199     Document Type: Article

References (12)

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