Wavelet transformation for gray-level corner detection

Pattern Recognition

Volumn 28, Issue 6, 1995, Pages 853-861

  Chen, Chin Hsing ^a   Lee, Jiann Shu ^a   Sun, Yung Nien ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Corner detection; Corner indicator; Edge image; Minima image; Orientation variance; Scale ratio; Wavelet transform

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; COMPUTER VISION; FEATURE EXTRACTION; SPURIOUS SIGNAL NOISE; WAVELET TRANSFORMS;

CORNER DETECTION; CORNER INDICATOR; NOISE CONTAMINATION; ORIENTATION VARIANCE; SCALE RATIO;

EDGE DETECTION;

EID: 0029324697     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/0031-3203(94)00169-M     Document Type: Article

References (25)

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