Combined Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Study of the Surface Segregation of Poly(methyl methacrylate) (PMMA) in Bisphenol a Polycarbonate/PMMA Blends

Macromolecules

Volumn 28, Issue 13, 1995, Pages 4631-4637

  Lhoest, J B ^a,b   Bertrand, P ^a,b   Weng, L T ^a,b   Dewez, J L ^a,c  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b Unité de Physico Chimie et de Physique des Matériaux ^*  (Japan)

^c Unité de Chimie des Interfaces ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; MORPHOLOGY; PHASE SEPARATION; POLYCARBONATES; POLYMETHYL METHACRYLATES; SECONDARY ION MASS SPECTROMETRY; SILICON WAFERS; SURFACE TENSION; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

BISPHENOL A POLYCARBONATES; BULK CONCENTRATION; DICHLOROMETHANE; QUANTITATIVE ANALYSIS; SURFACE SEGREGATION;

POLYMER BLENDS;

EID: 0029323110     PISSN: 00249297     EISSN: 15205835     Source Type: Journal    
DOI: 10.1021/ma00117a038     Document Type: Article

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