An accelerated life test model based on reliability kinetics

Technometrics

Volumn 37, Issue 2, 1995, Pages 133-146

  Meeker, William Q ^a   LuValle, Michael J ^b  

^a IOWA STATE UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

Censored data; Differential equations; Life data analysis; Maximum likelihood; Reliability

Indexed keywords

DATA REDUCTION; DIFFERENTIAL EQUATIONS; FAILURE ANALYSIS; KINETIC THEORY; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; REACTION KINETICS; REGRESSION ANALYSIS; RELIABILITY; RELIABILITY THEORY; STRESS ANALYSIS;

ACCELERATED LIFE TEST MODEL; CENSORED DATA; LIFE DATA ANALYSIS; MAXIMUM LIKELIHOOD; RELIABILITY KINETICS; STATISTICAL MODEL;

STATISTICAL TESTS;

EID: 0029309215     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1995.10484298     Document Type: Article

References (19)

1. Augis, J. A., DeNure, D. G., LuValle, M. J., Mitchell, J. P., Pinnel, M. R., and Welsher, T. L. (1989), “A Humidity Threshold for Conductive Anodic Filaments in Epoxy Glass Printed Wiring Boards,” in Proceedings of the 3rd International SAMPE Conference, Covina, CA: Society for the Advancement of Materials and Process Engineering, 1023-1030.
2. Birnbaum, Z. W., and Saunders, S. C. (1969), “A New Family of Life Distributions,” Journal of Applied Probability, 6, 319-327.
3. Brunauer, S., Emmett, P. H., and Teller, E. (1938), “Absorption of Gases in Multimolecular Layers,” Journal of the American Chemical Society, 60, 309-319.
4. Cook, R. D. (1986), “Assessment of Local Influence” (with discussion), Journal of the Royal Statistical Society, Ser. B, 48, 133-169.
5. Escobar, L. A., and Meeker, W. Q. (1992), “Assessing Influence in Regression Analysis With Censored Data,” Biometrics, 48,507-528.
6. Gillen, K. T., and Clough, R.L. (1985), “A Kinetic Model for Predicting Oxidative Degradation Rates in Combined Radiation-Thermal Environments,” Journal of Polymer Science, Polymer Chemistry Edition, 23,2683-2707.
7. Hahn, G. J., and Meeker, W. Q. (1991), Statistical Intervals: A Guide for Practitioners, New York: John Wiley.
8. Kemp, M. K. (1979), Physical Chemistry, New York: Marcel Dekker.
9. Klinger, D. J. (1991), “Humidity Acceleration Factor for Plastic Packaged Electronic Devices "Quality and Reliability Engineering International, 7, 365-370.
10. Lawless, J. F. (1982), Statistical Models and Methods for Lifetime Data, New York: John Wiley.
11. Lawless, J. F. (1986), “A Note of Lifetime Regression Models,” Biometrika, 73,509-512.
12. LuValle, M. J. (1990), “A Note on Experiment Design for Accelerated Life Tests,” Microelectronics Reliability, 30, 591-603.
13. LuValle, M. J., Welsher, T. L., and Mitchell, J. P. (1986), “A New Approach to the Extrapolation of Accelerated Life Test Data,” in The Proceedings of the Fifth International Conference on Reliability and Maintainability, Saint-Medard-en-Jalles, France: le Commissariat a I’ Energie Atomique, 620-635.
14. Lu Valle, M. J., Welsher, T. L., and Svoboda, K. (1988), “Acceleration Transforms and Statistical Kinetic Models,” Journal of Statistical Physics, 52, 311-320.
15. Martin, J. W. (1982), “Time Transformation Functions Commonly Used in Life Testing Analysis,” Durability of Building Materials, 1, 175-194.
16. Meeker, W. Q. (1987), “Limited Failure Population Life Tests: Application to Integrated Circuit Reliability,” Technometrics, 29, 51-65.
17. Nelson, W. (1990), Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, New York: John Wiley.
18. Vander Wiel, S.A., and Meeker, W. Q. (1990), “Accuracy of Approximate Confidence Bounds Using Censored Weibull Regression Data From Accelerated Life Tests,” IEEE Transactions on Reliability, R- 39,346-351.
19. Yost, F. G., and Hall, I. J. (1976), “Failure by the Processes of Nucléation and Growth,” IEEE Transactions on Reliability, R-25, 45—48.