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Volumn 150, Issue , 1995, Pages 277-284
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New frontiers of molecular beam epitaxy with in-situ processing
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
ELECTRON CYCLOTRON RESONANCE;
EPITAXIAL GROWTH;
FABRICATION;
IN SITU PROCESSING;
PLASMA ETCHING;
PLASMAS;
SECONDARY ION MASS SPECTROMETRY;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
CHEMICAL ETCHING;
PLASMA TREATMENT;
ULTRAHIGH VACUUM;
MOLECULAR BEAM EPITAXY;
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EID: 0029308904
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(95)80221-W Document Type: Article |
Times cited : (33)
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References (23)
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