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Volumn 146, Issue 3, 1995, Pages 256-266

Ac susceptibility measurements of magnetic monolayers: MCXD, MOKE, and mutual inductance

Author keywords

[No Author keywords available]

Indexed keywords

CURIE TEMPERATURE; X RAY DICHROISM;

EID: 0029307549     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00025-9     Document Type: Article
Times cited : (67)

References (45)
  • 22
    • 84915441362 scopus 로고    scopus 로고
    • B. Schulz, A. Aspelmeier and K. Baberschke, EVC-4 Proceedings, Vacuum, in print.
  • 26
    • 84915441361 scopus 로고    scopus 로고
    • H.P. Oepen, S. Knappmann and W. Wulfhekel, to be published.
  • 27
    • 84915441360 scopus 로고    scopus 로고
    • sat and Ȟ have units in gauss.
  • 28
    • 84915441359 scopus 로고    scopus 로고
    • M. Tischer, D. Arvanitis, A. Aspelmeier, M. Russo, F. May, J.H. Dunn and K. Baberschke; EVC-4 Proceedings, Vacuum, in press;
  • 32
    • 84915441358 scopus 로고    scopus 로고
    • sat values of Ni films do not depend on the direction of the magnetization.
  • 33
    • 84915441357 scopus 로고    scopus 로고
    • MCXD in SI units, but does not change the calibration in principle.
  • 41
    • 84915441356 scopus 로고    scopus 로고
    • The calculation of Ref. [38] has been reanalyzed in order to obtain average demagnetizing factors for n 〉 2, similar to those in Ref. [37].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.