Investigation of the Soft-Write Mechanism in Source-Side Injection Flash EEPROM Devices

IEEE Electron Device Letters

Volumn 16, Issue 5, 1995, Pages 181-183

  Maes, Herman E ^a   Van Hondt, Jan F ^a   Wellekens, Dirk ^a   Groeseneken, Guido ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DATA TRANSFER; ELECTRONS; GATES (TRANSISTOR); MOS DEVICES; RELIABILITY;

EEPROM; SOFT WRITE MECHANISM;

ROM;

EID: 0029307098     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.382233     Document Type: Article

References (9)

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