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Volumn 3, Issue 3, 1995, Pages 189-192

Optical properties of intrinsic silicon at 300 K

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; LIGHT ABSORPTION; LIGHT EXTINCTION; OPTICAL PROPERTIES; REFRACTIVE INDEX; SILICON;

EID: 0029306789     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.4670030303     Document Type: Article
Times cited : (1154)

References (15)
  • 1
    • 0026461497 scopus 로고
    • Optical functions of silicon determined by two‐channel polarization modulation ellipsometry
    • (1992) Opt. Mater. , vol.1 , pp. 41
    • Jellison, G.E.1
  • 8
    • 84990673080 scopus 로고
    • Optical Constants for Silicon at 300 K and 10 K Determined from 1.64 to 4.73 eV by Ellipsometry, Report ORNL/TM‐8002, Oak Ridge National Laboratory, February
    • (1982)
    • Jellison, G.E.1    Modine, F.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.