Parameter extraction for large‐signal modeling of bipolar junction transistors

International Journal of Microwave and Millimeter‐Wave Computer‐Aided Engineering

Volumn 5, Issue 3, 1995, Pages 161-172

  Rohringer, Norbert M ^a   Kreuzgruber, Peter ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC NETWORK ANALYSIS; ELECTRIC VARIABLES MEASUREMENT; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE TRANSMISSION; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; MATHEMATICAL MODELS; MICROWAVE DEVICES;

BOND WIRES; LARGE SIGNAL MODELLING; NONLINEAR BEHAVIOR; PARAMETER EXTRACTION; SILICON BIPOLAR JUNCTION TRANSISTORS;

BIPOLAR TRANSISTORS;

EID: 0029306719     PISSN: 10501827     EISSN: 15226301     Source Type: Journal    
DOI: 10.1002/mmce.4570050305     Document Type: Article

References (39)

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