Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings:enhanced transmittance matrix approach

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 12, Issue 5, 1995, Pages 1077-1086

  Moharam, M G ^a   Pommet, Drew A ^a   Grann, Eric B ^a   Gaylord, T K ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; DIELECTRIC MATERIALS; DIFFRACTION; EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE TRANSMISSION; MATRIX ALGEBRA; MAXWELL EQUATIONS; NUMERICAL METHODS; POLARIZATION; REFRACTIVE INDEX;

ENHANCE TRANSMITTANCE MATRIX METHOD; EVANESCENT FIELDS; MULTILEVEL GRATINGS; RIGOROUS COUPLED WAVE ANALYSIS; SINGLE VALUE DECOMPOSITION; SURFACE RELIEF GRATINGS;

DIFFRACTION GRATINGS;

EID: 0029306568     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.12.001077     Document Type: Article

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