A Direct Method for the Extraction of Diffusion Length and Surface Recombination Velocity from an EBIC Line Scan: Planar Junction Configuration

IEEE Transactions on Electron Devices

Volumn 42, Issue 5, 1995, Pages 963-968

  Chan, Daniel S H ^a   Ong, Vincent K S ^a   Phang, Jacob C H ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ELECTRIC CURRENTS; INTEGRATED CIRCUITS; LINEARIZATION; NUMERICAL METHODS; REGRESSION ANALYSIS; THREE DIMENSIONAL;

BULK MINORITY CARRIER DIFFUSION LENGTH; CHARGE COLLECTION CURRENT; PLANAR JUNCTION CONFIGURATION; SURFACE RECOMBINATION VELOCITY;

CHARGE CARRIERS;

EID: 0029306015     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.381995     Document Type: Article

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