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Volumn 58, Issue 2, 1995, Pages 175-184
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Determination of elastic strains in epitaxial layers by HREM
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Author keywords
[No Author keywords available]
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Indexed keywords
RELAXATION PROCESSES;
SEMICONDUCTING INDIUM COMPOUNDS;
STRAIN;
STRAIN MEASUREMENT;
SUPERLATTICES;
X RAY DIFFRACTION;
CUMULATIVE SUM OF DEVIATION;
LATTICE FRINGE SPACING;
ELECTRON MICROSCOPY;
ARTICLE;
ELASTICITY;
ELECTRON MICROSCOPY;
SEMICONDUCTOR;
STRESS STRAIN RELATIONSHIP;
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EID: 0029294421
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(94)00200-7 Document Type: Article |
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Times cited : (36)
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References (18)
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