Error Corrected Impedance Measurements with a Network Analyzer

IEEE Transactions on Instrumentation and Measurement

Volumn 44, Issue 2, 1995, Pages 295-299

  Heuermann, Holger ^a   Schiek, Burkhard ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CAPACITORS; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYZERS; ELECTRIC RESISTANCE; ERROR CORRECTION; MEASUREMENT THEORY; RESISTORS;

DEVICE UNDER TEST; MEASUREMENT CHANNELS; SELF CALIBRATION PROCEDURES; VECTOR NETWORK ANALYZER;

ELECTRIC IMPEDANCE MEASUREMENT;

EID: 0029292013     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.377835     Document Type: Article

References (6)

1. Hewlett Packard, “Automating the HP 8410B microwave network analyzer,” Appl. Note 221A, June 1980.
2. G. F. Engen and C. A. Hoer, “Thru-Reflect-Line: An improved technique for calibrating the dual six port automatic network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 987–993, Dec. 1979.
3. H. J. Eul and B. Schiek, “A generalized theory and new calibration procedures for network analyzer self-calibration,” IEEE Trans. Microwave Theory Tech., vol. 39, pp. 724–731, Apr. 1991.
4. H. Heuermann and B. Schiek, “Robust algorithms for Txx network analyzer procedures,” IEEE Trans. Instrum. Meas., vol. 43, pp. 18–23, Feb. 1994.
5. —, “Procedures for the determination of the scattering parameters for network analyzer calibration,” IEEE Trans. Instrum, Meas., vol. 43, pp. 528–531, Apr. 1993.
6. —, “Error corrected impedance measurements with a network analyzer,” Proc. CPEM'94 Conf., Boulder, CO, 1994, pp. 125–126.