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Volumn 22, Issue 3, 1995, Pages 229-237

Stress intensification near an elliptical crack border

Author keywords

[No Author keywords available]

Indexed keywords

CRACK BORDER; ELECTROELASTICITY; STRESS INTENSIFICATION;

EID: 0029291795     PISSN: 01678442     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-8442(94)00061-5     Document Type: Article
Times cited : (34)

References (6)
  • 1
    • 0003576772 scopus 로고
    • The analysis of dislocation, crack, and inclusion problems in piezoelectric solids
    • Stanford University
    • (1980) Ph.D. Thesis
    • Deeg1
  • 3
    • 0025601329 scopus 로고
    • Three-dimensional eigenfunctioin analysis of a crack in a piezoelectric material
    • (1990) Int. J. Solid Struct. , vol.26 , Issue.1 , pp. 1-15
    • Sosa1    Pak2
  • 5
    • 0028370960 scopus 로고
    • Penny-shaped crack in transversely isotropic piezoelectric materials
    • (1994) Acta Mech. Sinica , vol.10 , Issue.1 , pp. 49-60
    • Wang1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.