Effects of Electrical Stress Parameters on Polarization Loss in Ferroelectric P(L)ZT Thin Film Capacitors

IEEE Electron Device Letters

Volumn 16, Issue 4, 1995, Pages 130-132

  Khamankar, Rajesh B ^a   Kim, Jiyoung ^a   Jiang, Bo ^a   Lee, Jack C ^a   Sudhama, C ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; ELECTRIC NETWORK PARAMETERS; FATIGUE OF MATERIALS; FERROELECTRIC DEVICES; POLARIZATION; RANDOM ACCESS STORAGE; STRESSES; THIN FILM DEVICES;

POLARIZATION VOLTAGE LOOP SUBSTRATES; STRESS PULSES; STRESS VOLTAGE;

CAPACITORS;

EID: 0029290461     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.372491     Document Type: Article

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