Chemical Sensing Using Sol-Gel Derived Planar Waveguides and Indicator Phases

Analytical Chemistry

Volumn 67, Issue 8, 1995, Pages 1307-1314

  Yang, Lin ^a   Saavedra, S Scott ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED OPTICS; IONS; LEAD; OPTICAL COATINGS; OPTICAL WAVEGUIDES; PH EFFECTS; SOL-GELS;

ATTENUATED TOTAL REFLECTION; THICK GLASS LAYERS;

CHEMICAL SENSORS;

EID: 0029290021     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac00104a002     Document Type: Article

References (48)

1. Blinker, C. J.; Scherer, G. W., Sol-Gel Science; Academic: San Diego, CA, 1990.
2. Uhlmann, D. R.; Boulton, J. M.; Teowee, G.; Weisenbach, L.; Zelinski, B. J., J. Proc. SPIE 1990, 1328, 270-295.
3. Avnir, D.; Levy, D.; Reisfield, R., J. Phys. Chem. 1984, 88, 5956-5959.
4. Lev, O. Analysis 1992, 20, 543-553.
5. Zusman, R.; Rottman, C.; Ottolenghi, M.; Avnir, D., J. Non-Cryst. Solids 1990, 122, 107-109.
6. Iosefzon-Kuyavskaya, B.; Gigozin, I.; Ottolenghi, M.; Avnir, D.; Lev, O., J. Non-Cryst. Solids 1992, 147-148, 808-812.
7. Lev, O.; Iosefzon-Kuyavskaya, B.; Gigozin, I.; Ottolenghi, M.; Avnir, D., Fresenius J. Anal. Chem. 1992, 343, 370-372.
8. MacCraith, B. D.; Ruddy, V.; Potter, C.; O'Kelly, B.; McGilp, J. F., Electron. Lett. 1991, 27, 1247-1248.
9. Ding, J. Y.; Shahriari, M. R.; Sigel, G. H., Electron. Lett. 1991, 27, 1561-1562.
10. MacCraith, B. D.; McDonagh, C. M.; O'Keefe, G.; Keyes, E. T.; Vos, J. G.; O'Kelly, B.; McGilp, J. F., Analyst 1993, 118, 385-388.
11. Dulebohn, J. I.; Haefner, S. C.; Berglund, K. A.; Dunbar, K. R., Chem. Mater. 1992, 4, 506-508.
12. Lee, J. E.; Saavedra, S. S. Anal. Chim. Acta 1994, 285, 265-269.
13. Braun, S.; Shtelzer, S.; Rappoport, S.; Avnir, D., J. Non-Cryst. Solids 1992, 147-148, 739-743.
14. Shtelzer, S.; Rappoport, S.; Avnir, D.; Ottolenghi, M.; Braun, S., Biotechnol. Appt. Biochem. 1992, 15, 227-235.
15. Ellerby, L. M.; Nishida, C. R.; Nishida, F.; Yamanaka, S. A.; Dunn, B.; Valentine, J. S.; Zink, J. I., Science 1992, 255, 1113-1115.
16. Yamanaka, S. A.; Nishida, F.; Ellerby, L. M.; Nishida, C. R.; Dunn, B.; Valentine, J. S.; Zink, J. I., Chem. Mater. 1992, 4, 495-497.
17. Wu, S.; Ellerby, L. M.; Cohan, J. S.; Dunn, B.; El-Sayed, M. A.; Valentine, J. S.; Zink, J. I., Chem. Mater. 1993, 5, 115-120.
18. Wang, R.; Narang, U.; Prasad, P. N.; Bright, F. V., Anal. Chem. 1993, 65, 2671-2675.
19. Edmiston, P. L.; Wambolt, C. L.; Smith, M. K.: Saavedra, S. S., J. Colloid Interface Sci. 1994, 163, 395-406.
20. Kogelnik, H., In Topics in Applied Physics, Vol. 7, Integrated Optics', Tamir, T., Ed.; Springer-Verlag: Berlin, 1979; Chapter 2.
21. Saavedra, S. S.; Reichert. W. M., Anal. Chem. 1990, 62, 2251-2256.
22. Saavedra. S. S.; Reichert. W. M., iMngmuir 1991, 7, 995-999.
23. DeGrandpre. M. D.: Burgess, L. W.; White. P. L.; Goldman. D. S., Anal. Chem. 1990, 62. 2012-2017.
24. Walker. D. S.; Garrison, M. D.; Reichert W. M., J. Colloid Interface Sci. 1993, 157, 41-49.
25. Plowman. T. E.: Garrison. M. D.; Walker, D. S.; Reichert. W. M., Thin Solid Films 1994, 243. 610-615.
26. Reichert. W. M.: Ives. J. T.: Suci, P. A.; Andrade, J. D., Appl. Spectrosc. 1987. 41, 636-640.
27. Rabolt J. F.: Santo; R.; Schlotter, N. E.; Swalen; J. D., IBM J. Res. Dev. 1982, 26, 209-216.
28. Rabe, J. P.; Swalen; J. D.: Rabolt, J. F., J. Chem. Phys. 1987, 86, 1601-1607.
29. Miller, D. R.; Han, O. H.; Bohn, P. W., Appl. Spectrosc. 1987, 41, 249-255.
30. Bolton, B. A.; Scherer. J. R., J. Phys. Chem. 1989. 93, 7635-7640.
31. Walker, D. S.; Hellinga. H. W.; Saavedra, S. S.; Reichert W. M., J. Phys. Chem. 1993, 97. 10217-10222.
32. Bohn. P. W., TrAC, Trends Anal. Chem. 1987, 6. 223-233.
33. Choquette, S. J.; Locasio-Brown. L.; Durst R. A., Anal. Chem. 1992, 64, 55-60.
34. Tiefcnthaler, K.; Lukosz. W., Thin Solid Films 1985, 126, 205-211.
35. Nellen, Ph. M.; Tiefenthaler, K.; Lukosz, W., Sens. Actuators 1988, 15, 285-295.
36. Zhou, Y.; Magill, J. V.; Cushley, W.; Layboum, P. J. R.; Dc La Rue, R. M., J. Mol. Electron. 1991, 7, 135-149.
37. Yang, L.; Saavedra, S. S.; Armstrong, N. R.; Hayes, J., Anal. Chem. 1994. 66. 1254-1263.
38. Saavedra, S. S.; Reichert, W. M., Appl. Spectrosc. 1990, 44, 1210-1217.
39. Azzam, R. M. A.; Bashara, N. M., Ellipsometry and Polarized Light, North-Holland: Amsterdam, 1987; pp 315-320.
40. Saavedra, S. S.; Reichert, W. M., Appl. Spectrosc. 1990, 44, 1420-1423.
41. Guglielmi, M.; Colombo, P.; Esposti, L. M. D.; Righini, G. C.; Pelli, S.; Rigato, V., J. Non-Cryst. Solids 1992, 147-148, 641-645.
42. Walker, D. S.; Reichert, W. M.; Berry, C., J. Appl. Spedrosc. 1992, 46, 1437-1441.
43. U. S. Environmental Protection Agency, Office of Water and Hazardous Materials. Quality Criteria for Water, U. S. GPO: Washington, DC, 1976.
44. WSnninen, E., In Indicators; Bishop, E., Ed.; Pergammon Press: Braunschweig, FRG, 1972; Chapter 6B.
45. Ueno, K.; Imamura, T.; Cheng, K. L., Handbook of Organic Analytical Reagents, 2nd ed.; CRC Press: Boca Raton, FL, 1992; pp 287-303.
46. C. G. Zimba, Polaroid Corp., 750 Main St.-3D, Cambridge, MA 02139.
47. Lee, J. E.; Saavedra, S. S., unpublished data.
48. Bohn, P. W., Anal. Chem. 1985, 57, 1203-1208.