A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing

IEEE Transactions on Parallel and Distributed Systems

Volumn 6, Issue 4, 1995, Pages 363-372

  Huang, Kaiyuan ^a   Agarwal, Vinod K ^b   LaForge, Laurence ^c   Thulasiraman, K ^d  

^a NORTEL NETWORKS   (Canada)

^b MCGILL UNIVERSITY   (Canada)

^c UNIVERSITY OF NEVADA   (United States)

^d UNIVERSITY OF OKLAHOMA   (Canada)

Author keywords

diagnosis algorithm; Probabilistic diagnosis; production testing; system level diagnosis; VLSI testing

Indexed keywords

ALGORITHMS; COMPUTER CIRCUITS; ELECTRIC NETWORK ANALYSIS; MICROPROCESSOR CHIPS; PROBABILITY; RELIABILITY; VLSI CIRCUITS;

CONSTANT DEGREE STRUCTURES; DIAGNOSIS ALGORITHM; PROBABILISTIC DIAGNOSIS; PRODUCTION TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0029289923     PISSN: 10459219     EISSN: None     Source Type: Journal    
DOI: 10.1109/71.372790     Document Type: Article

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